Data di Pubblicazione:
2001
Abstract:
The BaBar Silicon Vertex Tracker (SVT) is a five layer device, made from double-sided silicon strip detectors and read out via a custom time-over-threshold circuit, the AToM chip. The SVT is an essential part of the physics program of BaBar, and is able to reconstruct B meson decay vertices with a precision sufficient to measure time-dependent CP violating asymmetries at the PEP-II asymmetric e(+)e(-) collider. This report will give an overview of the SVT, with particular focus on the performance of the SVT, which has been taking colliding beam data since May 1999.
Tipologia CRIS:
Articolo su Rivista
Keywords:
BABAR; silicon vertex tracker; B meson decay vertices
Elenco autori:
Bozzi, C; Carassiti, V; Ramusino, Ac; Dittongo, S; Folegani, M; Piemontese, L; Abbott, Bk; Breon, Ab; Clark, Ar; Dow, S; Fan, Q; Goozen, F; Hernikl, C; Karcher, A; Kerth, Lt; Kipnis, I; Kluth, S; Lynch, G; Levi, M; Luft, P; Luo, L; Nyman, M; Pedrali Noy, M; Roe, Na; Zizka, G; Roberts, D; Schieck, J; Barni, D; Brenna, E; Defendi, I; Forti, A; Giugni, D; Lanni, F; Palombo, F; Vaniev, V; Leona, A; Mandelli, E; Manfredi, Pf; Perazzo, A; Re, V; Angelini, C; Batignani, G; Bettarini, S; Bondioli, M; Bosi, F; Calderini, G; Carpinelli, M; Dutra, F; Forti, F; Gagliardi, D; Giorgi, Ma; Lusiani, A; Mammini, P; Morganti, M; Morsani, F; Paoloni, E; Profeti, A; Rama, M; Rampino, G; Rizzo, G; Sandrelli, F; Simi, G; Triggiani, G; Tritto, S; Vitale, R; Burchat, P; Cheng, C; Kirkby, D; Meyer, T; Roat, C; Bona, M; Bianchi, F; Daudo, F; Di Girolamo, B; Gamba, D; Giraudo, G; Grosso, P; Romero, A; Smol, A; Trapani, P; Zanin, D; Bosisio, L; Della Ricca, G; Lanceri, L; Pompili, A; Poropat, P; Prest, Michela; Rastelli, C; Vallazza, E; Vuagnin, G; Hast, C; Potter, Ep; Sharma, V; Burke, S; Callahan, D; Campagnari, C; Dahmes, B; Eppich, A; Hale, D; Hall, K; Hart, P; Kuznetsova, N; Kyre, S; Levy, S; Long, O; May, J; Richman, J; Verkerke, W; Witherell, M; Beringer, J; Eisner, Am; Frey, A; Grillo, A; Grothe, M; Johnson, R; Kroeger, W; Lockman, W; Pulliam, T; Rowe, W; Schmitz, R; Seiden, A; Spencer, E; Turri, M; Wilder, M; Charles, E; Elmer, P; Nielsen, J; Orejudos, W; Scott, I; Walsh, J; Zobernig, H.
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