A measurement of Lorentz angle and spatial resolution of radiation hard silicon pixel sensors

Gorelov, I; Gorfine, G; Hoeferkamp, M; Seidel, Sc; Ciocio, A; Einsweiler, K; Gilchriese, M; Joshi, A; Kleinfelder, S; Marchesini, R; Milgrome, O; Palaio, N; Pengg, F; Richardson, J; Zizka, G; Ackers, M; Fischer, P; Keil, M; Meuser, S; Stockmanns, T; Treis, J; Wermes, N; Gossling, C; Hugging, F; Wustenfeld, J; Wunstorf, R; Barberis, D; Beccherle, R; Cervetto, M; Darbo, G; Gagliardi, G; Gemme, C; Morettini, P; Netchaeva, P; Osculati, B; Parodi, F; Rossi, L; Dao, K; Fasching, D; Blanquart, L; Breugnon, P; Calvet, D; Clemens, Jc; Delpierre, P; Hallewell, G; Laugier, D; Mouthuy, T; Rozanov, A; Trouilleau, C; Valin, I; Aleppo, M; Andreazza, A; Caccia, Massimo; Lari, T; Meroni, C; Ragusa, F; Troncon, C; Vegni, G; Rohe, T; Boyd, Gr; Severini, H; Skubic, Pl; Snow, J; Sicho, P; Tomasek, L; Vrba, V; Holder, M; Lipka, D; Ziolkowski, M; Cauz, D; D'Auria, S; DEL PAPA, C; Grassman, H; Santi, L; Becks, Kh; Gerlach, P; Grah, C; Gregor, I; Harenberg, T; Linder, C.