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Light Scattering and Turbidimetry Techniques for the Characterization of Nanoparticles and Nanostructured Networks

Academic Article
Publication Date:
2022
abstract:
Light scattering and turbidimetry techniques are classical tools for characterizing the dynamics and structure of single nanoparticles or nanostructured networks. They work by analyzing, as a function of time (Dynamic Light Scattering, DLS) or angles (Static Light Scattering, SLS), the light scattered by a sample, or measuring, as a function of the wavelength, the intensity scattered over the entire solid angle when the sample is illuminated with white light (Multi Wavelength Turbidimetry, MWT). Light scattering methods probe different length scales, in the ranges of ~5-500 nm (DLS), or ~0.1-5 μm (Wide Angle SLS), or ~1-100 μm (Low Angle SLS), and some of them can be operated in a time-resolved mode, with the possibility of characterizing not only stationary, but also aggregating, polymerizing, or self-assembling samples. Thus, the combined use of these techniques represents a powerful approach for studying systems characterized by very different length scales. In this work, we will review some typical applications of these methods, ranging from the field of colloidal fractal aggregation to the polymerization of biologic networks made of randomly entangled nanosized fibers. We will also discuss the opportunity of combining together different scattering techniques, emphasizing the advantages of a global analysis with respect to single-methods data processing.
Iris type:
Articolo su Rivista
Keywords:
colloidal aggregation; dynamic light scattering; fractal morphology; static light scattering; turbidimetry
List of contributors:
Anzini, Pietro; Redoglio, Daniele; Rocco, Mattia; Masciocchi, Norberto; Ferri, Fabio
Authors of the University:
FERRI FABIO
MASCIOCCHI NORBERTO
Handle:
https://irinsubria.uninsubria.it/handle/11383/2138572
Full Text:
https://irinsubria.uninsubria.it//retrieve/handle/11383/2138572/184579/Nanomaterials_2022-Anzini-LS%20review.pdf
Published in:
NANOMATERIALS
Journal
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