Data di Pubblicazione:
2000
Abstract:
The Silicon Vertex Tracker (SVT) of the BaBar experiment at the PEP-II asymmetric B factory consists of five layers of double-sided, AC-coupled silicon strip detectors. The detectors are readout with a custom IC, capable of simultaneous acquisition, digitization and transmission of data. The SVT geometry is shown and the construction phases of its modules are described in detail, with emphasis on the bending procedures needed for the arch-modules of the outer layers.
Tipologia CRIS:
Articolo su Rivista
Keywords:
Silicon Vertex Tracker; BABAR; b-factory; silicon strip
Elenco autori:
Bozzi, C; Carassiti, V; Ramusino, Ac; Dittongo, S; Folegani, M; Piemontese, L; Abbott, Bk; Breon, Ab; Clark, Ar; Dow, S; Fan, Q; Goozen, F; Hernikl, C; Karcher, A; Kerth, Lt; Kipnis, I; Kluth, S; Lynch, G; Levi, M; Luft, P; Luo, L; Nyman, M; Pedrali Noy, M; Roe, Na; Zizka, G; Roberts, D; Barni, D; Brenna, E; Defendi, I; Forti, A; Giugni, D; Lanni, F; Palombo, F; Vaniev, V; Leona, A; Mandelli, E; Manfredi, Pf; Perazzo, A; Re, V; Angelini, C; Batignani, G; Bettarini, S; Bondioli, M; Bosi, F; Calderini, G; Carpinelli, M; Dutra, F; Forti, F; Gagliardi, D; Giorgi, Ma; Lusiani, A; Mammini, P; Morganti, M; Morsani, F; Paoloni, E; Profeti, A; Rama, M; Rampino, G; Rizzo, G; Sandrelli, F; Simi, G; Triggiani, G; Tritto, S; Vitale, R; Burchat, P; Cheng, C; Kirkby, D; Meyer, T; Roat, C; Bona, M; Bianchi, F; Daudo, F; Di Girolamo, B; Gamba, D; Giraudo, G; Grosso, P; Romero, A; Smol, A; Trapani, P; Zanin, D; Bosisio, L; Della Ricca, G; Lanceri, L; Pompili, A; Poropat, P; Prest, Michela; Rastelli, C; Vallazza, E; Vuagnin, G; Hast, C; Potter, Ep; Sharma, V; Burke, S; Callahan, D; Campagnari, C; Dahmes, B; Eppich, A; Hale, D; Hall, K; Hart, P; Kuznetsova, N; Kyre, S; Levy, S; Long, O; May, J; Richman, J; Verkerke, W; Witherell, M; Beringer, J; Eisner, Am; Frey, A; Grillo, A; Grothe, M; Johnson, R; Kroeger, W; Lockman, W; Pulliam, T; Rowe, W; Schmitz, R; Seiden, A; Spencer, E; Turri, M; Wilder, M; Charles, E; Elmer, P; Nielsen, J; Orejudos, W; Scott, I; Walsh, J; Zobernig, H.
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