Electrical characteristics of silicon pixel detectors

Gorelov, I; Gorfine, G; Hoeferkamp, M; MATA BRUNI, V; Santistevan, G; Seidel, Sc; Ciocio, A; Einsweiler, K; Emes, J; Gilchriese, M; Joshi, A; Kleinfelder, S; Marchesini, R; Mccormack, F; Milgrome, O; Palaio, N; Pengg, F; Richardson, J; Zizka, G; Ackers, M; Comes, G; Fischer, P; Keil, M; Martinez, G; Peric, I; Runolfsson, O; Stockmanns, T; Treis, J; Wermes, N; Gossling, C; Hugging, F; KLAIBER LODEWIGS, J; Krasel, O; Wustenfeld, J; Wunstorf, R; Barberis, D; Beccherle, R; Caso, C; Cervetto, M; Darbo, G; Gagliardi, G; Gemme, C; Morettini, P; Netchaeva, P; Osculati, B; Rossi, L; Charles, E; Fasching, D; Blanquart, L; Breugnon, P; Calvet, D; Clemens, Jc; Delpierre, P; Hallewell, G; Laugier, D; Mouthuy, T; Rozanov, A; Valin, I; Andreazza, A; Caccia, Massimo; Citterio, M; Lari, T; Meroni, C; Ragusa, F; Troncon, C; Vegni, G; Lutz, G; Richter, Rh; Rohe, T; Boyd, Gr; Skubic, Pl; Sicho, P; Tomasek, L; Vrba, V; Holder, M; Ziolkowski, M; Cauz, D; COBAL GRASSMANN, M; D'Auria, S; DE LOTTO, B; DEL PAPA, C; Grassmann, H; Santi, L; Becks, Kh; Lenzen, G; Linder, C.